Edge list

Results from ConceptNet 5.8

Source: OpenCyc 2012
en semiconductor wafer processing metrology (n)
― IsA ⟶
Weight: 1.0
en semiconductor industry metrology (n) Source: OpenCyc 2012
en semiconductor wafer processing metrology (n)
― IsA ⟶
Weight: 1.0
en metrology (n) Source: OpenCyc 2012
en photolithography semiconductor metrology (n)
― IsA ⟶
Weight: 1.0
en semiconductor wafer processing metrology (n) Source: OpenCyc 2012
Creative Commons License
ConceptNet 5 is licensed under a Creative Commons Attribution-ShareAlike 4.0 International License. If you use it in research, please cite this AAAI paper.
See Copying and Sharing ConceptNet for more details.